Thesis Abstracts 2003

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Simultaneous Conductivity and Thickness Measurements Using Pulsed Eddy Current

By: Lefebvre, J.H. Vivier MASc. (Chemical and Material Engineering)

Supervisor: Dr Stéphane Dubois (Captain)

Abstract

Pulsed Eddy Currents have the ability to penetrate deep into conductive materials of one or multiple layers. The precise evaluation of the material’s parametric such as conductivity, thickness, gap between plates, or the dimensions and location of defects is sensitive to variations in the distance between the object and the probe (Lift-Off). The Lift-Off point of Interception (LOI) inspection method develop at RMC has the ability to provide measurements independent of probe to object distance. This study shows that it is possible to measure thickness and conductivity of a metal plate separately or simultaneously using the LOI method. Using two concentric coils, the inner coil for exciting currents and the outer coil as a sensor, the study shows that the conductivity and thickness can be measured simultaneously with a deviation of 3.1% and 6.8% compared to their respective nominal values.